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In this course, students are introduced to advanced electron microscopy techniques required to characterize a wide range of materials from the sub-micron to the atomic scale.With a combination of lectures, practical sessions on the microscopes and data analysis session, the student learn a wide of techniques including Electron Energy Loss Spectroscopy (EELS). Students learn through examples how

Digitalization, reading and interpretation of geological maps.

Theory and lab demo of scanning electron microscope (SEM) and electron microprobe analysis (EPMA) applied to geological materials: introduction to the instruments, interaction of electron with matter, electron imaging (SE, BSE, CL), electron backscatter diffraction (EBSD), X-ray analysis for the chemical characterisation of solid material at the micron-scale.

The introductory course on Focused Ion Beam (FIB) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations and hands-on sessions.

Introduction to Scanning Electron Microscopy and Microanalysis including Practical training.

The introductory course on Scanning Electron Microscopy (SEM) emphasizes hands-on learning. Using 2 SEM instruments, students have the opportunity to study their own samples, or standard test samples, as well as solving exercises provided by ScopeM scientists.