VVZ API is not affiliated with ETH Zurich. Data might be outdated or incorrect. Please view the official ETHZ Vorlesungsverzeichnis for binding information.
Introduction to scanning electron microscopy
Einführung in die Rasterelektronenmikroskopie
Last Updated: 2026-02-05 15:06:21
Abstract
Basics of scanning electron microscopy and microanalysis
Objective
Introduction to scanning electron microscopy and microanalysis. Acquire practical experience as a SEM operator.
Content
Principle and operation modes of scanning electron microscopes. Methods and application fields of - imaging (SE, BSE, FSE, AE, CL), - X-ray spectroscopy (EDX), - electron diffraction (EBSD, Channeling, Orientation Imaging). Methods of sample preparation practical exercises
Resources
Lecture Notes
Handouts and instruction manuals will be provided
Literature
- Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press (1996). - Goldstein et al: Scanning Elektron Microscopy and X-Ray Microanalysis. Plenum Press New York London (1981).
General Information
- Language
- German
- Levels
- DS , MSC
- Frequency
- Yearly recurring
Examination
- Type
- ungraded semester performance
Course Components
| Type | Title | Time & Place | Hours |
|---|---|---|---|
| lecture with exercise |
Einführung in die Rasterelektronenmikroskopie
Blockkurs nach Vereinbarung
Ort: HPT C107; 9-12 und 14-17 Uhr.
|
No time listed | 2 h weekly |
Offered In
-
-
Advanced Studies (These courses normally have to be attended in the 5th or the 7th semester. The complementary courses are sumarized at the end.)
-
-
-
-