Nanocharacterization using Analytical Electron Microscopy

Abstract

In this course, students are introduced to advanced electron microscopy techniques required to characterize a wide range of materials from the sub-micron to the atomic scale.With a combination of lectures, practical sessions on the microscopes and data analysis session, the student learn a wide of techniques including Electron Energy Loss Spectroscopy (EELS). Students learn through examples how

Objective

The aim of this course is to familiarize the students with methods such as Electron Energy Loss Spectroscopy (EELS), Energy Dispersive Spectroscopy (EDS) as well as more specific techniques. By the end of the course, the students should be then able to decide which technique to use to answer various scientific question that requires nano-characterization. Through hands-on session on Electron Microscopes as well as data analysis session under supervision, the students learn how to acquire spectra inside the microscope and to obtain elemental as well as chemical map through their analysis.

Content

This advanced course provides hand-on sessions on the most frequently used analytical EM techniques. By the end of the course, students will understand the physical processes EELS and other spectroscopy technique. The topic of data reliability and accuracy is also covered, and the course explain how various experimental factors can affect them. The students are offered the opportunity to apply those techniques on their own projects. - Introduction to analytical electron microscopy: fundamentals on electron-matter scattering and instrumentation. - EEL spectrum: acquisition and interpretation. - Spatially resolved Spectroscopy: Spectrum Imaging. - Practical sessions on energy filtered TEM (EFTEM): data acquisition and analysis. - Practical on STEM-EELS: data acquisition and analysis. The hand-on sessions are to be carried-out on real specimens, provided by lecturers and / by students.

Resources