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In this course, students are introduced to advanced electron microscopy techniques required to characterize a wide range of materials from the sub-micron to the atomic scale.With a combination of lectures, practical sessions on the microscopes and data analysis session, the student learn a wide of techniques including Electron Energy Loss Spectroscopy (EELS). Students learn through examples how

Anisotropy of rocks: from laboratory measurements to numerical prediction. Link between structural geology, petrology and geophysics.Rheology of rocks: from laboratory measurements to flow laws used for numerical modelling. Special emphasis on plastic deformation.

Practical work on TEM, SEM, FIB and APTtreatment of typical problemsdata analysis, writing of a report

A comprehensive understanding of the interaction of electrons and ions with condensed matter and details on the instrumentation and methods designed to scan, transmit, and point-project these probes for the structural and chemical analysis of various materials.

The introductory course on Focused Ion Beam (FIB) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations and hands-on sessions.

Introduction to Scanning Electron Microscopy and Microanalysis including Practical training.

The introductory course on Scanning Electron Microscopy (SEM) emphasizes hands-on learning. Using 2 SEM instruments, students have the opportunity to study their own samples, or standard test samples, as well as solving exercises provided by ScopeM scientists.

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