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327-0703-00L 4 Credits DR , MSC D-CHAB , D-MATL , D-PHYS , D-ERDW , D-ITET
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Electron and Ion Microscopy in Materials Science

Electron and Ion Microscopy in Material Science

Lecturers & Examiners: Dr. Karsten Kunze, Dr. Eszter Barthazy Meier, Dr. Fabian Gramm, Dr. Joakim Reuteler, Prof. Dr. Rolf Erni, Dr. Stephan Gerstl, Dr. Andres Käch
Former title: Electron Microscopy in Material Science
VVZ CR n/a

Last Updated: 2026-06-01 11:30:49

Abstract

A comprehensive understanding of the interaction of electrons and ions with condensed matter and details on the instrumentation and methods designed to scan, transmit, and point-project these probes for the structural and chemical analysis of various materials.

Objective

A comprehensive understanding of the interaction of electrons and ions with condensed matter and details on the instrumentation and methods designed to scan, transmit, and point-project these probes for the structural and chemical analysis of various materials.

Content

This course provides a general introduction to the electron- and ion- microscopy methods applied to characterizing inorganic and organic materials. In the first part, the basics of transmission- (TEM) and scanning electron microscopy (SEM) are presented with insights of imaging and image processing. The second part includes the most important aspects of specimen preparation strategies, focused ion-beam (FIB), atom probe tomography (APT), and in-situ microscopy methods. Throughout the semester, various applications in materials science, solid state physics, structural biology, structural geology, and structural chemistry will be reported.

Resources

Lecture Notes

will be distributed in English

Literature

Goodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000 Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014 Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013 Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008 Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015) N. Yao, ed., Focused ion beam systems: Basics and applications. Cambridge University Press, 2007 Larson, David: Local Electrode Atom Probe Tomography. Springer Series in Materials Science, New York (2013)

General Information

Language
English
Levels
DR , MSC
Frequency
Yearly recurring

Examination

Type
session examination
Mode
oral 30 minutes
ZWISCHENPRÜFUNG: Ein schriftlicher Test findet Mitte des Semesters statt. Teilnahme ist fakultativ. Ergebnis wird zu 30% an die Gesamtnote angerechnet, wenn damit eine bessere Note erreicht wird.INTERIM ASSESSMENT: A written test takes place in mid semester. Attendance is optional. Result will be counted with 30% weight for final mark, if this would lead to a better mark.

Course Components

Type Title Time & Place Hours
lecture Electron and Ion Microscopy in Material Science
  • Fri 07:45-09:30 (HCI H 2.1)
  • 07.11 Date 08:00-09:35 (HIL E 4)
2 h weekly
exercise Electron and Ion Microscopy in Material Science
  • Fri 11:45-13:30 (HCI H 2.1)
2 h weekly

Offered In