Practical work on TEM, SEM, FIB and APTtreatment of typical problemsdata analysis, writing of a report

A comprehensive understanding of the interaction of electrons and ions with condensed matter and details on the instrumentation and methods designed to scan, transmit, and point-project these probes for the structural and chemical analysis of various materials.

The introductory course on Focused Ion Beam (FIB) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations and hands-on sessions.

The main aim of the course is to enable the students to independently choose a suitable material characterization methods to address a specific materials science question. Subject areas are: light microscopy, diffraction methods (X-rays, neutrons, electrons), electron microscopy, atom probe tomography and atomic force microscopy. Depending on lecturer, lectures and practicals in German or English.

The introductory course on Scanning Electron Microscopy (SEM) emphasizes hands-on learning. Using 2 SEM instruments, students have the opportunity to study their own samples, or standard test samples, as well as solving exercises provided by ScopeM scientists.