Materials Characterization II

Abstract

The main aim of the course is to enable the students to independently choose a suitable material characterization methods to address a specific materials science question. Subject areas are: light microscopy, diffraction methods (X-rays, neutrons, electrons), electron microscopy, atom probe tomography and atomic force microscopy. Depending on lecturer, lectures and practicals in German or English.

Objective

- Being able to explain the fundamentals of basic and advanced materials characterization methods based on microscopy and diffraction modalities. - Being able to identify and solve practical problems of selected characterization methods based on corresponding laboratory work. - Being able to advice non-experts why, how and when these methods can be used to assess what type of information, and to draw awareness to possible problems and limitations of these methods.

Content

In the first part of the semester, different lecturers will present the fundamentals of the materials characterization methods mentioned above. This is the lecture part of the course. In the second half of the semester, the students, grouped in teams, will apply selected methods. These laboratory works are at the heart of the course, where the students are faced with practical problems and the limitations of the different methods, and where they have to independently elaborate solutions within the teams. Special: some practical courses are offered at the Paul Scherrer Institute, where the students can make use of the neutron and synchrotron X-ray facilities. These courses will take place after the end of the semester and occupy half and full days.

Resources