Structural characterization: RBS, surface analyses, optical methods, applications in electronic devices and sensors.homepage:www.tfp.ethz.ch

Basic properties, growth and applications of thin single crystal (epitaxial), polycrystalline and amorphous layers on various substrates. Content: -Vacuum, evaporation, condensation, deposition (epitaxy) from gas or liquid phase, compound semiconductors, heteroepitaxy, mechanical stresses and dynamics of dislocations;homepage:www.tfp.ethz.ch