VVZ API is not affiliated with ETH Zurich. Data might be outdated or incorrect. Please view the official ETHZ Vorlesungsverzeichnis for binding information.
Materials analysis by nuclear techniques
Materialanalyse mit kernphysikalischen Methoden
Last Updated: 2026-02-05 15:29:36
Abstract
Materials analysis by MeV ion beams. Nuclear techniques are presented which allow to quantitatively investigate the composition, structure and trace element content of solids.The course is also well suited for graduate students.
Objective
Students learn the basic concepts of ion beam analysis and its different analytical techniques. They understand how experimental data is taken and interpreted. They are able to chose the appropriate method of analysis to solve a given problem.
Content
The course treats applications of nuclear methods in other fields of research. Materials analysis by ion beam analysis is emphasized. Techniques are presented which allow the quantitative investigation of composition, structure, and trace element content of solids: - elasic nuclear scattering (Rutherfor Backscattering, Recoil detection) - nuclear (resonant) reaction analysis - activation analysis - ion beam channeling (investigation of crystal defects) - neutron sources - MeV ion microprobes, imaging surface analysis The course is also suited for graduate students.
Resources
Lecture Notes
Lecture notes will be distributed.
Literature
'Fundamentals of Surface and Thin Film Analysis', L.C. Feldman, J.W. Mayer, North Holland 1986.
General Information
- Language
- German
- Levels
- MSC
- Frequency
- Yearly recurring
Examination
- Type
- session examination
- Mode
- oral 20 minutes
Course Components
| Type | Title | Time & Place | Hours |
|---|---|---|---|
| lecture | Materialanalyse mit kernphysikalischen Methoden |
|
2 h weekly |
| exercise | Materialanalyse mit kernphysikalischen Methoden | No time listed | 1 h weekly |