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Scanning Probe Techniques
Rastersensor-Methoden
Last Updated: 2026-02-05 15:14:40
Abstract
The theoretical foundations of scanning tunneling microscopy and spectroscopy and their application to semiconducting and metallic surfaces are treated, as well as the relation between atomic forces and the tunnel effect, and the scanning force microscope. Ballistic electron emission microscopy is shown to provide an extension of the scanning tunneling microscope to the study of buried interfaces.
Objective
Understanding the theoretical basis of the scanning tunneling microscope. knowledge of the atomic and electronic structure of selected metal and semiconductor surfaces, quantum interference phenomena in thin metallic films, understanding the relation between atomic forces and electronic properties, understanding the basics of ballistic transport across interfaces between solids.
Content
Die Vorlesung behandelt die theoretischen Grundlagen der Rastertunnel-Mikroskopie und -Spektroskopie und ihre Anwendung auf halbleitende und metallische Oberflächen. Der Zusammenhang zwischen den atomaren Kräften und dem Tunneleffekt wird erläutert und das Atomkraft-Mikroskop besprochen. Eine Erweiterung des Rastertunnel-Mikroskops zur Untersuchung von vergrabenen Grenzflächen wird anhand der ballistischen-Elektronen-Emissions-Mikroskopie demonstriert.
Resources
Lecture Notes
A script in German will be distributed
General Information
- Language
- German
- Levels
- MSC
- Frequency
- Yearly recurring
Examination
- Type
- session examination
- Mode
- oral 20 minutes
Course Components
| Type | Title | Time & Place | Hours |
|---|---|---|---|
| lecture | Rastersensor-Methoden |
|
2 h weekly |
| exercise | Rastersensor-Methoden | No time listed | 1 h weekly |