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Measuring on the Nanometer Scale
Last Updated: 2026-02-05 15:19:57
Abstract
Introduction to theory and practical application of measuring techniques suitable for the nano domain. Includes hands-on lab course.
Objective
Introduction to theory and practical application of measuring techniques suitable for the nano domain. Includes hands-on lab course.
Content
Conventional techniques to analyze nano structures using photons and electrons: light microscopy with dark field and differential interference contrast; scanning electron microscopy, transmission electron microscopy. Interferometric and other techniques to measure distances. Optical traps. Foundations of scanning probe microscopy: tunneling, atomic force, optical near-field. Interactions between specimen and probe. Current trends, including spectroscopy of material parameters.
Resources
Lecture Notes
Class notes and special papers will be distributed.
General Information
- Language
- English
- Levels
- MSC
- Frequency
- Yearly recurring
Examination
- Type
- session examination
- Mode
- oral 30 minutes
Course Components
| Type | Title | Time & Place | Hours |
|---|---|---|---|
| lecture with exercise |
Measuring on the Nanometer Scale
(davon 2 Stunde nach Vereinbarung))
|
|
4 h weekly |