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151-0622-00L 5 Credits

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Measuring on the Nanometer Scale

Lecturers: Prof. em. Dr. Andreas Stemmer, Dr. Yury Belyaev, Dr. Nicola Naujoks

Examiners: Prof. em. Dr. Andreas Stemmer, Dr. Nicola Naujoks

VVZ CR n/a

Last Updated: 2026-02-05 15:10:23

Abstract

Introduction to theory and practical application of measuring techniques suitable for the nano domain. Includes hands-on lab course.

Objective

Introduction to theory and practical application of measuring techniques suitable for the nano domain. Includes hands-on lab course.

Content

Conventional techniques to analyze nano structures using photons and electrons. Interferometric and other techniques to measure distances. Optical traps. Foundations of scanning probe microscopy: tunneling, atomic force, optical near-field. Interactions between specimen and probe. Current trends, including spectroscopy of material parameters.

General Information

Language: English
Frequency: Yearly recurring

Examination

Type: session examination
Mode: oral 30 minutes

Course Components