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227-0148-00L

VLSI 4: Practical VLSI: Measurement and Testing

VVZ CR n/a

Last Updated: 2026-07-21 00:35:27

Abstract

In this revamped course, we will concentrate on practical aspects of modern integrated circuit testing with an emphasis on hands-on-experience on an IC tester. This will help students to better understand several aspects that have been highlighted in previous VLSI lecture series and allow them to test their own ICs designed during prior semester/bachelor theses.

Objective

In this course, students will: - Get hands-on experience working in a modern IC Test laboratory and learn the steps needed to bring-up, characterize and test digital integrated circuits. - Develop problem solving skills and get experience in approaching issues that involve many different engineering steps. - Gather first hand experience how Design-For-Test (DFT) methodologies help for IC Design, and understand the trade-offs between performance and testability. - Learn about challenges of IC Manufacturing process, and what kind of failures can be encountered, and get a deeper understanding of IC Design process - For students that have worked on a prior bachelor/semester thesis on an IC design project, allow them to test their own IC.

Content

If you want to earn money by selling ICs, you will have to deliver a product that will function properly with a very large probability. This lecture will be discussing how this can be achieved. The main point of emphasis will be hands-on-exercises on a state-of-the-art automated test equipment (Advantest SoC V93000) where students will work in groups of two (or maximum three). Students will be able to schedule their exercises so that it fits their individual schedule. There will also be concentrated classroom lectures that will convey the necessary information that students will need for the exercises which will cover aspects of - Economics of testing - CMOS manufacturing and fault models, stuck at faults - Automated Test Equipment - Measuring timing and power - Testing of memories - Built in Self-Test (BIST) There will be 10 lectures (some weeks will be lecture free, exact schedule to be communicated) and 8 exercises. The final exercise will involve individual work where students test an IC with the knowledge they gained from previous exercises. Students that complete this exercise and present a test report (4-10 pages) will pass the course. Please note that the exercises in this class are involved and will require you to make preparations in advance. Expect to spend at least 4 hours of your own time for exercise preparations, and expect at least three individual half day sessions for the final exercise where you test the IC to qualify for a passing grade. It will be possible to finish the exercises until the end of July.

Resources

Lecture Notes

The following book will accompany students during the lecture: "Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits" by Michael L. Bushnell and Vishwani D. Agrawal, Springer, 2004. This book is available online within ETH throughhttp://link.springer.com/book/10.1007%2Fb117406

Literature

Course website: https://vlsi4.ethz.ch

General Information