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327-2126-00L 2 Credits DR , MSC D-HEST , D-MATL , D-PHYS
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Microscopy Training TEM I - Introduction to TEM

Lecturers & Examiners: Dr. Eszter Barthazy Meier, Dr. Fabian Gramm, Dr. Alla Sologubenko, Dr. Anne Greet Bittermann, Dr. Peng Zeng, Stephan Handschin, Miroslav Peterek, Dr. Bilal Qureshi
Limited number of participants. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee.
VVZ CR n/a

Last Updated: 2026-06-01 11:30:57

Abstract

The introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for beginners who are interested in using TEM for their Master or PhD thesis. TEM sample preparation techniques are also discussed. During hands-on sessions at different TEM instruments, students will have the opportunity to examine their own samples if time allows.

Objective

Understanding of 1. the set-up and individual components of a TEM 2. the basics of electron optics and image formation 3. the basics of electron beam – sample interactions 4. the contrast mechanism 5. various sample preparation techniques Learning how to 1. align and operate a TEM 2. acquire data using different operation modes of a TEM instrument, i.e. Bright-field and Dark-field imaging 3. record electron diffraction patterns and index diffraction patterns 4. interpret TEM data

Content

Lectures: - basics of electron optics and the TEM instrument set-up - TEM imaging modes and image contrast - STEM operation mode - Sample preparation techniques for hard and soft materials Practicals: - Demo, practical demonstration of a TEM: instrument components, alignment, etc. - Hands-on training for students: sample loading, instrument alignment and data acquisition. - Sample preparation for different types of materials - Practical work with TEMs - Demonstration of advanced Transmission Electron Microscopy techniques

Resources

Lecture Notes

Lecture notes will be distributed.

Literature

- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007

General Information

Language
English
Levels
DR , MSC
Frequency
Semesterly recurring

Examination

Type
ungraded semester performance
Oral presentation and discussion of the data acquired during the course.

Registration & Places

Limited places (Special selection)
Signup End
10.11.2025

Course Components

Type Title Time & Place Hours
practical/laboratory course Microscopy Training TEM I - Introduction to TEM
This block course will take place during 5 full days 24-28 November 2025. Lectures will be held in the seminar room, practical exercises in rooms of ScopeM. There will be no repetition of this course, but it's offered every semester.
  • 24.11 Date 07:45-13:30 (HIT F 11.1)
  • 25.11 Date 07:45-13:30 (HIT F 11.1)
  • 26.11 Date 07:45-13:30 (HIT F 11.1)
  • 28.11 Date 11:45-15:30 (HIT F 11.1)
35 h semesterly

Offered In