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327-2126-00L 2 Credits DR , MSC D-HEST , D-MATL
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Microscopy Training TEM I - Introduction to TEM

Lecturers & Examiners: Dr. Eszter Barthazy Meier, Dr. Fabian Gramm, Dr. Alla Sologubenko, Dr. Anne Greet Bittermann, Dr. Peng Zeng, Stephan Handschin, Miroslav Peterek, Dr. Bilal Qureshi, Dr. Cecilia Bebeacua
Limited number of participants. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee.
VVZ CR n/a

Last Updated: 2026-06-01 11:33:18

Abstract

The introductory course on Transmission Electron Microscopy (TEM) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations, and hands-on sessions.

Objective

- Overview of TEM theory, instrumentation, operation and applications. - Alignment and operation of a TEM, as well as acquisition and interpretation of images, diffraction patterns, accomplishing basic tasks successfully. - Knowledge of electron imaging modes (including Scanning Transmission Electron Microscopy), magnification calibration, and image acquisition using CCD cameras. - To set up the TEM to acquire diffraction patterns, perform camera length calibration, as well as measure and interpret diffraction patterns. - Overview of techniques for specimen preparation.

Content

Using two Transmission Electron Microscopes the students learn how to align a TEM, select parameters for acquisition of images in bright field (BF) and dark field (DF), perform scanning transmission electron microscopy (STEM) imaging, phase contrast imaging, and acquire electron diffraction patterns. The participants will also learn basic and advanced use of digital cameras and digital imaging methods. - Introduction and discussion on Electron Microscopy and instrumentation. - Lectures on electron sources, electron lenses and probe formation. - Lectures on beam/specimen interaction, image formation, image contrast and imaging modes. - Lectures on sample preparation techniques for EM. - Brief description and demonstration of the TEM microscope. - Practice on beam/specimen interaction, image formation, Image contrast (and image processing). - Demonstration of Transmission Electron Microscopes and imaging modes (Phase contrast, BF, DF, STEM). - Student participation on sample preparation techniques. - Transmission Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities. - TEM alignment, calibration, correction to improve image contrast and quality. - Electron diffraction. - Practice on real-world samples and report results.

Resources

Literature

- Detailed course manual - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007

General Information

Language
English
Levels
DR , MSC
Frequency
Semesterly recurring

Examination

Type
ungraded semester performance
Oral presentation and discussion about the TEM/STEM images and results obtained during the course.

Registration & Places

Limited places (Special selection)
Signup End
28.04.2025

Course Components

Type Title Time & Place Hours
practical/laboratory course Microscopy Training TEM I - Introduction to TEM
This block course will take place during 5 full days (9am-5pm) on May 12-16, 2025. Lectures will be held in the seminar room, practical exercises in rooms of ScopeM. There will be no repetition of this course, but it's offered every semester.
  • 12.05 Date 07:45-13:30 (HPZ E 35)
  • 13.05 Date 07:45-13:30 (HPZ E 35)
  • 14.05 Date 07:45-13:30 (HPZ E 35)
  • 16.05 Date 11:45-15:30 (HPZ E 35)
35 h semesterly

Offered In