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Scattering Techniques for Material Characterization
Last Updated: 2026-02-05 16:29:11
Abstract
The lecture presents the currently most efficient experimental techniques for microstructure material characterization: X-ray diffraction (XRD) and transmission electron microscopy (TEM). The theoretical basics, instrumentation, complementarity and exclusivity of both techniques will be taught. The course includes practical elements and examples of current research projects at D-MATL.
Objective
Students are able to do: - systematically characterise the microstructure and phases of a given material with X-rays and electrons - select the right tool (source, instrument, measurement strategy) and design a workflow for solving a microstructure or phase analysis problem - describe possibilities and limitations of a given characterisation method - comprehensively store experimentally collected data in a repository following modern data management rules such that data can be evaluated by students not involved in the experiment - qualitatively and quantitatively evaluate and present experimental data and results collected by others
Content
The main objective of this hands-on practical course is to give students a comprehensive insight into the most important aspects of microstructure characterization using electron and X-ray scattering. The focus is on the complementarity and exclusivity of the two techniques. We will introduce the most important material characterization tasks, present the relevant physical and crystallographic fundamentals, and discuss how the tasks can be solved with electron and X-ray scattering. We will discuss intrinsic and extrinsic advantages and limitations of the methods and explain essential instrumentation requirements specific to each setup. Another essential facet of the course is the link to everyday D-MATL project problems presented by the lecturers or researchers from D-MATL. The lecture is accompanied by hands-on experiments on samples of D-MATL projects using state-of-the-art instruments.
Resources
Literature
- Diffraction Analysis of the Microstructure of Materials, E.J. Mittemeijer, P.Scardi, Springer, 2004. - Fundamentals of Powder Diffraction and Structural Characterization of Materials, 2nd ed., V. K. Pecharsky, P. Y. Zavalij, Springer, 2009. - Transmission Electron Microscopy and Diffractometry of Materials, B. Fultz and J.M. Howe, Springer 2001. - Electron Microscopy and Analyses, 3rd ed., P. J. Goodhew, J. Humphreys, R. Beanland, Taylor & Francis 2001.
General Information
- Language
- English
- Levels
- DR , MSC
- Frequency
- Yearly recurring
Examination
- Type
- session examination
- Mode
- oral 30 minutes
Registration & Places
- Signup End
- 18.09.2024
Course Components
| Type | Title | Time & Place | Hours |
|---|---|---|---|
| lecture |
Scattering Techniques for Material Characterization
Does not take place this semester.
|
No time listed | 2 h weekly |
| exercise |
Scattering Techniques for Material Characterization
Does not take place this semester.
|
No time listed | 1 h weekly |
Offered In
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Elective Courses (The students are free to choose individually from the entire course offer of ETH Zürich on the Master level. Please consult the study administration in case of questions.)
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Doctorate Materials Science (Further information at: )
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