VVZ API is not affiliated with ETH Zurich. Data might be outdated or incorrect. Please view the official ETHZ Vorlesungsverzeichnis for binding information.

327-2128-00L 2 Credits DR , MSC D-MATL
You're viewing possible stale or outdated data. Please check the latest semester for more up-to-date information.

High Resolution Transmission Electron Microscopy

Lecturers: Prof. Dr. Rolf Erni
Does not take place this semester. Limited number of participants. More information here: Registration form: ( )
VVZ CR n/a

Last Updated: 2026-02-05 16:07:28

Abstract

This advanced course on High Resolution Transmission Electron Microscopy (HRTEM) provides lectures focused on HRTEM and HRSTEM imaging principles, related data analysis and simulation and phase restoration methods.

Objective

- Learning how HRTEM and HRSTEM images are obtained. - Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them. - Learning about TEM and STEM images simulation software. - Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions).

Content

This course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them. Topics: 1. Introduction to HRTEM and HRSTEM 2. Considerations on (S)TEM instrumentation for high resolution imaging 3. Lectures on aberrations, aberration correction and aberration corrected images 4. HRTEM and HRSTEM simulation 5. Data analysis, phase restoration and lattice-strain analysis

Resources

Literature

- Detailed course manual - Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009 - Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016 - Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015. - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007

General Information

Language
English
Levels
DR , MSC
Frequency
Semesterly recurring

Examination

Type
ungraded semester performance
oral presentation

Registration & Places

Limited places (Special selection)
Signup End
14.06.2022

Course Components

Type Title Time & Place Hours
lecture with exercise High Resolution Transmission Electron Microscopy
Does not take place this semester.
No time listed 40 h semesterly

Offered In