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Abstract
Introduction to Scanning Electron Microscopy and Microanalysis including Practical training.
Objective
Introduction in scanning electron microscopy and microanalysis. Obtain practical experience in operating a SEM.
Content
Functional principles and operation modes of a scanning electron microscope. Methods and application fields for - imaging (SE, BSE, FSE, AE, CL), - X-ray spectroscopy (EDX) - Electron diffraction (EBSD, Channeling, Orientation Imaging). Methods for sample preparation Practical exercises.
Resources
Lecture Notes
Scripts and operation manuals are provided during the course.
Literature
- Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press (1996). - Schmidt: Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse. Expert-Verlag Renningen-Malmsheim (1994). - Reimer, Pfefferkorn: Rasterelektronenmikroskopie. Springer Berlin (1973). - Goldstein et al: Scanning Elektron Microscopy and X-Ray Microanalysis. Plenum Press New York London (1981).
General Information
- Language
- English
- Levels
- MSC
- Frequency
- Yearly recurring
Examination
- Type
- ungraded semester performance
Course Components
| Type | Title | Time & Place | Hours |
|---|---|---|---|
| lecture with exercise |
Introduction to Scanning Electron Microscopy
Does not take place this semester.
|
No time listed | 2 h weekly |
Offered In
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Electives (Courses can be chosen from the complete offerings of the ETH Zurich and University of Zurich (according to prior agreement with the subject advisor).)
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