VVZ API is not affiliated with ETH Zurich. Data might be outdated or incorrect. Please view the official ETHZ Vorlesungsverzeichnis for binding information.
Abstract
Failures have to be avoided by proper design, material selection and manufacturing. Properties, degradation mechanisms, and expected lifetime of materials are introduced and the basics of failure analysis and analysis equipment are presented. Failures will be demonstrated experimentally and the opportunity is offered to perform a failure analysis with advanced equipment in the laboratory.
Objective
Introduction to the degradation and failure mechanisms and causes of electronic components, devices and systems as well as to methods and tools of reliability testing, characterization and failure analysis.
Content
Summary of reliability and failure analysis terminology; physics of failure: materials properties, physical processes and failure mechanisms; failure analysis of ICs, PCBs, opto-electronics, discrete and other components and devices; basics and properties of instruments; application in circuit design and reliability analysis
Resources
Lecture Notes
Comprehensive copy of transparencies
General Information
- Language
- English
- Levels
- DR
- Frequency
- Yearly recurring
Examination
- Type
- session examination
- Mode
- oral 30 minutes
Course Components
| Type | Title | Time & Place | Hours |
|---|---|---|---|
| lecture |
Physics of Failure and Failure Analysis of Electronic Devices and Equipment
Does not take place this semester.
|
No time listed | 2 h weekly |
Offered In
-
Doctoral Dep. of Information Technology and Electrical Engineering (More Information at: )
-
Doctoral and Post-Doctoral Courses (A minimum of 12 ECTS credit points must be obtained during doctoral studies. The courses on offer below are only a small selection out of a much larger available number of courses. Please discuss your course selection with your PhD supervisor.)
-