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151-0622-00L 2 Credits BSC , MSC , NDS D-HEST , D-MAVT , D-PHYS , D-ITET , D-MATL
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Measuring on the Nanometer Scale

Lecturers & Examiners: Prof. em. Dr. Andreas Stemmer
VVZ CR n/a

Last Updated: 2026-02-05 15:42:08

Abstract

Introduction to theory and practical application of measuring techniques suitable for the nano domain.

Objective

Introduction to theory and practical application of measuring techniques suitable for the nano domain.

Content

Conventional techniques to analyze nano structures using photons and electrons: light microscopy with dark field and differential interference contrast; scanning electron microscopy, transmission electron microscopy. Interferometric and other techniques to measure distances. Optical traps. Foundations of scanning probe microscopy: tunneling, atomic force, optical near-field. Interactions between specimen and probe. Current trends, including spectroscopy of material parameters.

Resources

Lecture Notes

Class notes and special papers will be distributed.

General Information

Language
English
Levels
BSC , MSC , NDS
Frequency
Yearly recurring

Examination

Type
session examination
Mode
oral 30 minutes

Course Components

Type Title Time & Place Hours
lecture with exercise Measuring on the Nanometer Scale
  • Thu 10:15-12:00 (ML F 34)
2 h weekly

Offered In