Advanced Surface Characterisation Techniques

Abstract

This course will be dedicated to the application of surface analytical techniques for the characterization of nanostructured materials and the understanding of their reactivity. Applications to innovative materials relevant for industries will be provided during the course.

Objective

Acquisition of a sound basis on qualitative and quantitative analysis of XPS, AES and SIMS data based on practical examples and exercises from tribology, polymer science, biomaterials, passivity, nanostructured materials (according to the interests of participants). Learn the capabilities and limitations of the techniques for materials characterization.

Content

XPS and AES: Instrumental parameters (sources, analyzer); data acquisition; energy and intensity calibration; data processing (satellite subtraction, background subtraction, curve-fitting); qualitative analysis (BE shifts, satellites); quantitative analysis of homogeneous, layered and nanostructured surfaces. Examples will cover chemical, physical, & electrical characterization of films, surfaces, particles & interfaces. Errors in quantitative analysis; transmission function, comparison of data from different instruments; depth-profiling techniques; imaging acquisition and processing SIMS: Principle of the technique; overview on the instrumentation: Choice of primary ion; Mass scale calibration; Linearity of the intensity scale (dead-time correction); Repeatability and reproducibility; an introduction to data interpretation and multivariate techniques will be also provided. Composition depth-profiling by XPS and Auger over 100's nm is presented by using noble gas ions (e.g. Ar+) sputtering while acquiring spectra. The advantages and limitations of depth-profiling with C60 source that reduces or eliminates sputter induced artifacts for organic materials will be discussed. Angle Resolved XPS in combination with mathematical methods can provide gradient and layer ordering information within the first monolayers down to 10 nm:practical examples will be presented. ISO and ASTM standards will be also presented during the course. Case studies, Visit to the laboratory, Computer-assisted data processing in the classroom.

Resources