VVZ API is not affiliated with ETH Zurich. Data might be outdated or incorrect. Please view the official ETHZ Vorlesungsverzeichnis for binding information.
Electron and Ion Microscopy in Materials Science
Electron and Ion Microscopy in Material Science
Last Updated: 2026-06-03 00:07:35
Abstract
A comprehensive understanding of the interaction of electrons and ions with condensed matter and details on the instrumentation and methods designed to scan, transmit, and point-project these probes for the structural and chemical analysis of various materials.
Objective
A comprehensive understanding of the interaction of electrons and ions with condensed matter and details on the instrumentation and methods designed to scan, transmit, and point-project these probes for the structural and chemical analysis of various materials.
Content
This course provides a general introduction to the electron- and ion- microscopy methods applied to characterizing inorganic and organic materials. In the first part, the basics of transmission- (TEM) and scanning electron microscopy (SEM) are presented with insights of imaging and image processing. The second part includes the most important aspects of specimen preparation strategies, focused ion-beam (FIB), atom probe tomography (APT), and in-situ microscopy methods. Throughout the semester, various applications in materials science, solid state physics, structural biology, structural geology, and structural chemistry will be reported.
Resources
Lecture Notes
will be distributed in English
Literature
Goodhew, Humphreys, Beanland: Electron Microscopy and Analysis, 3rd. Ed., CRC Press, 2000 Thomas, Gemming: Analytical Transmission Electron Microscopy - An Introduction for Operators, Springer, Berlin, 2014 Thomas, Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einführung für den Praktiker, Springer, Berlin, 2013 Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 Reimer, Kohl: Transmission Electron Microscopy, 5th Ed., Berlin, 2008 Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015) N. Yao, ed., Focused ion beam systems: Basics and applications. Cambridge University Press, 2007 Larson, David: Local Electrode Atom Probe Tomography. Springer Series in Materials Science, New York (2013)
General Information
- Language
- English
- Levels
- DR , MSC
- Frequency
- Yearly recurring
Examination
- Type
- session examination
- Mode
- oral 30 minutes
Course Components
| Type | Title | Time & Place | Hours |
|---|---|---|---|
| lecture | Electron and Ion Microscopy in Material Science | No time listed | 2 h weekly |
| exercise | Electron and Ion Microscopy in Material Science | No time listed | 2 h weekly |
Offered In
-
-
-
Electives (Students are free to choose from a range of D-CHAB chemistry courses appropriate to their level of study (please note admission requirements). In case of doubt, contact the student administration.)
-
-
-
Electives (Courses can be chosen from the complete offerings of the ETH Zurich and University of Zurich (according to prior agreement with the subject advisor).)
-
-
-
-
General Electives (Students may choose General Electives from the entire course programme of ETH Zurich - with the following restrictions: courses that belong to the first or second year of a Bachelor curriculum at ETH Zurich as well as courses from GESS "Science in Perspective" are not eligible here. The following courses are explicitly recommended to physics students by their lecturers. (Courses in this list may be assigned to the category "General Electives" directly in myStudies. For the category assignment of other eligible courses keep the choice "no category" and take contact with the Study Administration ( ) after having received the credits.))
-
-
-
-
Doctorate Materials Science (Further information at: )
-